1. A general semiconductor parameter measurement tool software FastLab; FastLab is a general-purpose semiconductor parameter measurement tool software designed primarily for automated IV/CV characterization of on-chip semiconductor devices in semiconductor labs in collaboration with probe stations and measuring instruments.
The software is user-friendly, easy to operate and comprehensive.
The integration of machine learning algorithms enables fast measurement. It can be combined with other analysis tools such as MeQLab, such as graphical data output.
Compatible with current main flow measuring instruments and probe stations. Friendly interface, easy to operate and comprehensive functions.
LabVIEW semiconductor testing
Built-in major device types and support for custom devices; Built-in comprehensive IV/CV/SPEC measurement database, convenient for users to call, efficient measurement content setting.
Highly integrated GUI interface, which can easily and quickly complete the setting and management of measuring instruments, switch matrices and probe stations; Set the measurement content of different devices through Routine, and all settings support one-click export and import of Excel .xls format.
According to the test requirements, the measurement plan can be quickly formulated, including Sub Die information and Device measurement content, which can realize the automatic measurement of different dies and different subdies.
Test data supports output formats such as .dat and .xls.
With rich output graphic display mode, through the View Group function to quickly export a variety of formats (.PDF, .docx, .PPT) graphic report function.
Suitable for IV/CV measurements of a wide range of device types
Suitable for reliability measurements of a wide range of device types.
Through GPIB connection, the semi-automatic probe station can be dynamically and interactively controlled with the matrix switch and IV/CV test instrument, so as to realize manual or automatic on-chip testing.
2. Use LabVIEW to develop semiconductor chip automatic test system
The semiconductor chip automatic test system can test multiple sets of devices under test (DUT) fixed on the underlying package plate. The system performs a description of the electrical and optical characteristics for each DUT. In test development, the software can determine the correct position of each chip in the test process. Getting the right location is extremely important for all process steps.
3. Anzhidao inspection APP is a very good construction machine inspection service platform, the software has the functions of construction machine inspection, inspection, patrol inspection, and generation of machine inspection report. Testing services include: over-service life tower cranes, construction lifts and other equipment structure testing safety assessment, construction machinery installation quality inspection, construction machinery performance inspection, construction machinery structural performance testing, construction machinery accident detection and analysis and other inspection services, safety inspection service outsourcing, etc.
Software that needs to be learned for semiconductor processes: semiconductor process simulation software mainly includes Synopsys' TCAD and Coventor's SEMulator3D; The main software in terms of layout is Virtuoso of Cadence, Calibre of Mentor, and Legacy of Synopsys.
Servo motor enable parameter setting
Working in the direction of semiconductor processes, drawing layouts, and DRC inspection are essential skills.
4. Semiconductor defect detection - DLIA industrial defect software
Semiconductor defect detection - DLIA industrial defect software
DLIA (Deep Learning for Industrial Applications) is an intelligent industrial visual defect detection solution based on deep learning, used to solve industrial complex defect classification, detection and other problems, suitable for various industrial complex environments, with defect automatic learning function, the more learning the higher the detection rate and recognition accuracy.